发明名称 METHOD AND APPARATUS FOR MEASURING JITTER
摘要 A method and an apparatus for measuring jitter of an optical disk are provided to improve operation speed and apply to a high speed optical disk by storing a jitter value on an on-chip memory. A method for measuring jitter comprises the steps of: detecting a point of zero cross from digital RF data by receiving the digital RF data and a system clock signal, and calculating a jitter value(92); detecting a data pattern at the point of zero cross(93); and storing the calculated jitter value on a jitter memory corresponding to the detected data pattern in a matrix type(94).
申请公布号 KR20080088304(A) 申请公布日期 2008.10.02
申请号 KR20070031141 申请日期 2007.03.29
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, TAE HO
分类号 G11B7/005;G11B7/00;G11B7/09;G11B20/18 主分类号 G11B7/005
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