发明名称 |
METHOD AND APPARATUS FOR MEASURING JITTER |
摘要 |
A method and an apparatus for measuring jitter of an optical disk are provided to improve operation speed and apply to a high speed optical disk by storing a jitter value on an on-chip memory. A method for measuring jitter comprises the steps of: detecting a point of zero cross from digital RF data by receiving the digital RF data and a system clock signal, and calculating a jitter value(92); detecting a data pattern at the point of zero cross(93); and storing the calculated jitter value on a jitter memory corresponding to the detected data pattern in a matrix type(94).
|
申请公布号 |
KR20080088304(A) |
申请公布日期 |
2008.10.02 |
申请号 |
KR20070031141 |
申请日期 |
2007.03.29 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, TAE HO |
分类号 |
G11B7/005;G11B7/00;G11B7/09;G11B20/18 |
主分类号 |
G11B7/005 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|