发明名称 |
System and method for simultaneous optimization of multiple scenarios in an integrated circuit design |
摘要 |
The present invention provides a system and method for concurrently performing analysis and optimization of an integrated circuit (IC) design in multiple scenarios. The system is based on a distributed computing model, where any optimization change introduced in one scenario is immediately tested in all other scenarios. This ensures that modifications made to the design do not affect other scenarios. The invention significantly reduces the execution time of the optimization and signoff flows in the design of ICs. In addition, the computing means required for simultaneously testing multiple scenarios are standard and affordable.
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申请公布号 |
US2008244476(A1) |
申请公布日期 |
2008.10.02 |
申请号 |
US20070732384 |
申请日期 |
2007.04.02 |
申请人 |
ATHENA DESIGN SYSTEMS, INC. |
发明人 |
FOTAKIS DIMITRIS K.;HEMBRUCH MATTIAS;KIANI PAYAM |
分类号 |
G06F17/50 |
主分类号 |
G06F17/50 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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