发明名称 RESIST COMPOSITION AND PATTERNING PROCESS
摘要 <p>A resist material is provided to improve the contrast by modifying the surface layer of photoresist, thereby improving the rectangularity of a pattern and mask reliability, and to prevent generation of a mixed layer of a resist layer with a protective layer in immersion lithography. A resist material comprises a polymer compound functioning as a base resin that undergoes a change in alkali solubility under the action of an acid, and a polymeric additive comprising a polymer compound obtained by copolymerizing repeating units having ammonium carboxylate groups and repeating units having at least one fluorine atom. The resist material is used as a chemically amplified negative or positive material.</p>
申请公布号 KR20080088509(A) 申请公布日期 2008.10.02
申请号 KR20080029062 申请日期 2008.03.28
申请人 SHIN-ETSU CHEMICAL CO., LTD. 发明人 KOBAYASHI TOMOHIRO;HATAKEYAMA JUN;HARADA YUJI
分类号 G03F7/004 主分类号 G03F7/004
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