发明名称 |
RESIST COMPOSITION AND PATTERNING PROCESS |
摘要 |
<p>A resist material is provided to improve the contrast by modifying the surface layer of photoresist, thereby improving the rectangularity of a pattern and mask reliability, and to prevent generation of a mixed layer of a resist layer with a protective layer in immersion lithography. A resist material comprises a polymer compound functioning as a base resin that undergoes a change in alkali solubility under the action of an acid, and a polymeric additive comprising a polymer compound obtained by copolymerizing repeating units having ammonium carboxylate groups and repeating units having at least one fluorine atom. The resist material is used as a chemically amplified negative or positive material.</p> |
申请公布号 |
KR20080088509(A) |
申请公布日期 |
2008.10.02 |
申请号 |
KR20080029062 |
申请日期 |
2008.03.28 |
申请人 |
SHIN-ETSU CHEMICAL CO., LTD. |
发明人 |
KOBAYASHI TOMOHIRO;HATAKEYAMA JUN;HARADA YUJI |
分类号 |
G03F7/004 |
主分类号 |
G03F7/004 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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