发明名称 SYSTEM AND METHOD FOR MEASURING LIGHT WAVEFORM
摘要 PROBLEM TO BE SOLVED: To execute precisely measuring of a light waveform to be measured. SOLUTION: In a light waveform measuring system 100, a phase comparator 150 compares the phase of the electric signal output from a PD140b with that of the electric signal output from a Mixer200, and outputs the phase signal in proportion to the phase difference between these electric signals as an error signal to a VCO170 through a LPF160. The jitter of the electric signal output from a VCO170 is eliminated by a BPF180, and based on the electric signal after eliminating the jitter, a sampling pulse light source 210 emits a sampling light. A light sampling gate 120 samples the signal light to be measured with the sampling light output from the sampling pulse light source 210, and an oscilloscope 220 measures the sampled signal to be measured. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008232767(A) 申请公布日期 2008.10.02
申请号 JP20070071678 申请日期 2007.03.19
申请人 FUJITSU LTD 发明人 FUTAMI FUMIO;WATANABE SHIGEKI
分类号 G01J11/00;G02F1/35 主分类号 G01J11/00
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