发明名称 EXTENDER STRIP AND TEST ASSEMBLY FOR TESTING MEMORY CARD OPERATION
摘要 A semiconductor device is disclosed including die bond pads which are heightened to allow wire bonding of offset stacked die even in tight offset configurations. After a first die is affixed to a substrate, one or more layers of an electrical conductor may be provided on some or all of the die bond pads of the first substrate to raise the height of the bond pads. The conductive layers may for example be conductive balls deposited on the die bond pads of the first substrate using a known wire bond capillary. Thereafter, a second die may be added, and wire bonding of the first die may be accomplished using a known wire bond capillary mounting a wire bond ball on a raised surface of a first semiconductor die bond pad.
申请公布号 US2008244140(A1) 申请公布日期 2008.10.02
申请号 US20070693648 申请日期 2007.03.29
申请人 CHIOU ALAN;QAWAMI BAHMAN;SABET-SHARGHI FARSHID 发明人 CHIOU ALAN;QAWAMI BAHMAN;SABET-SHARGHI FARSHID
分类号 H05K7/10 主分类号 H05K7/10
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