发明名称 MEASURING INSTRUMENT
摘要 PROBLEM TO BE SOLVED: To provide a measuring instrument capable of precisely detecting the wavelength of reflected light, having without having to narrow the wavelength region which is a target of measurement. SOLUTION: The measuring instrument is constituted so that preparatory detection for detecting the wavelength of reflected light by a wavelength detection part 40, in a state where the first wavelength range that is the measuring target is set to a light extracting part 20 and the wavelength of the reflected light is subsequently detected by the wavelength detection part 40, in a state where a second wavelength range which is narrower than the first wavelength range containing the wavelength detected by the preparatory detection, is set to the light extracting part 20. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008232742(A) 申请公布日期 2008.10.02
申请号 JP20070071023 申请日期 2007.03.19
申请人 FUJIFILM CORP 发明人 NISHIO TOMONOBU
分类号 G01N21/27 主分类号 G01N21/27
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