发明名称 INTEGRATED CIRCUITS INCLUDING REVERSE ENGINEERING DETECTION USING DIFFERENCES IN SIGNALS
摘要 An active shield can be configured to receive a test signal, and configured to output a plurality of shield signals, derived from the test signal, via a plurality of signal paths. A compare logic can be configured to compare the test signal with each of the plurality of shield signals to provide at least two comparison signals indicating comparison results and can be configured to output the at least two comparison signals. A detection and decision logic can be configured to determine whether the active shield is subject to attack based on patterns of the at least two comparison signals.
申请公布号 US2008244749(A1) 申请公布日期 2008.10.02
申请号 US20080052427 申请日期 2008.03.20
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 DEROUET ODILE
分类号 G06F11/00 主分类号 G06F11/00
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