发明名称 Integration Scheme for Dual Work Function Metal Gates
摘要 A method for making PMOS and NMOS transistors 60, 70 on a semiconductor substrate includes having a gate hardmask over the gate electrode layer during the formation of transistor source/drain regions. The method includes an independent work function adjustment process that implants Group IIIa series dopants into a gate polysilicon layer of a PMOS transistor and implants Lanthanide series dopants into a gate polysilicon layer of NMOS.
申请公布号 US2008237743(A1) 申请公布日期 2008.10.02
申请号 US20070694662 申请日期 2007.03.30
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 RAMIN MANFRED;PAS MICHAEL
分类号 H01L29/78;H01L21/8238 主分类号 H01L29/78
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