| 摘要 |
<p>A semiconductor device and a semiconductor device module are provided to enhance a semiconductor module by testing accurately connecting states of internal lines between semiconductor devices. A semiconductor module selects a first semiconductor device(10) and a second semiconductor device(20). The first semiconductor device includes first internal connection terminals(IT11-IT13) connected to the second semiconductor device through internal lines, external connection terminals connected to terminals in order to receive external potential, and a first connection switch for connecting the selected first internal connection terminal as a test target with the external connection terminal. The second semiconductor device includes first internal connection terminals(IT21-IT23) connected to the first semiconductor device through internal lines, and a second connection switch for supplying reference potential to the second internal connection terminal as a test target in a first state, and supplying the reference potential to the residual second internal connection terminals in a second state.</p> |
