发明名称 FINE PARTICLE DEPOSIT AMOUNT MEASUREMENT METHOD OF HONEYCOMB STRUCTURE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a method usable for on-board diagnosis of fine particles. <P>SOLUTION: In a honeycomb structure which includes a plurality of circulation holes partitioned by a partition wall and penetrating in an axis direction and keeps three or more electrodes on a side surface so as to be equally distant from one end surface and to separate from one another, arbitrary two electrodes are selected from the electrodes to measure an electrical characteristic between the two electrodes. On the basis of the measured electrical characteristic, the fine particle deposition amount measurement method of the honeycomb structure determines a fine particle deposition amount in a zone between the arbitrary two electrodes in the honeycomb structure. <P>COPYRIGHT: (C)2009,JPO&INPIT</p>
申请公布号 JP2008231930(A) 申请公布日期 2008.10.02
申请号 JP20070068333 申请日期 2007.03.16
申请人 NGK INSULATORS LTD 发明人 KATSUYAMA KYOSUKE;KITO MASANOBU;MIYAIRI YUKIO;SAKUMA TAKESHI
分类号 F01N3/02;B01D46/00;B01D46/42;G01N27/02;G01N27/04;G01N27/22 主分类号 F01N3/02
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