发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device which has two insulation layers having different patterns formed by one mask step, and a method of manufacturing the same. SOLUTION: In the semiconductor device having double insulation layers, the double insulation layers include: a first insulation layer having a first pattern; a second insulation layer which has a pattern differing from that of the first pattern and includes a material differing from that of the first insulation layer and is provided on the first insulation layer; a first region in which the first insulation layer and the second insulation layer overlap; a second region in which the first insulation layer is disposed; and a third region in which the insulation layers are absent. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008233844(A) 申请公布日期 2008.10.02
申请号 JP20070134649 申请日期 2007.05.21
申请人 SAMSUNG SDI CO LTD 发明人 TEI JINEI;IM CHOONG-YOUL
分类号 G09F9/30;H01L21/312;H01L21/336;H01L21/768;H01L27/32;H01L29/786;H01L51/50;H05B33/06;H05B33/10;H05B33/22 主分类号 G09F9/30
代理机构 代理人
主权项
地址