发明名称 Method and apparatus for reducing substrate temperature variability
摘要 A method and apparatus for treating a substrate in a processing system. The processing system includes a process chamber having a pumping system configured to evacuate the process chamber, a substrate holder coupled to the process chamber and configured to support the substrate and heat the substrate, and a process gas delivery system coupled to the process chamber and configured to introduce a process gas to a process space above an upper surface of the substrate. Furthermore, the process chamber includes one or more apparatus surfaces in radiative communication with the upper surface of the substrate and having a low emissivity and/or high reflectivity.
申请公布号 US2008241379(A1) 申请公布日期 2008.10.02
申请号 US20070730282 申请日期 2007.03.30
申请人 TOKYO ELECTRON LIMITED 发明人 SUZUKI KENJI;VUKOVIC MIRKO
分类号 C23C16/00 主分类号 C23C16/00
代理机构 代理人
主权项
地址