摘要 |
<p>A method for scanning a semiconductor layout, the layout comprising objects with edges and corners, the method comprising identifying locally closest point pairs, identifying a proximity relation between two parallel edges where the parallel edges have at least one locally closest point pair in common and storing the proximity relation in a proximity relations table of a database together with a reference to the corresponding pair of edges. Locally closest point pairs are identified where the first edge and the second edge are not in contact with each other, a distance between the first point and the second point is the shortest distance between the first edge and the second edge, and a convex bounding area with the first point and the second point on its boundary contains no edge.</p> |
申请人 |
SAGANTEC ISRAEL LTD;EL YAHYAOUI, FARID;GISBERGEN, VAN, JOZEFUS, GODEFRIDUS, GERARDUS, PANCRATIUS;WILLEKENS, JEROEN, PIETER, FRANK |
发明人 |
EL YAHYAOUI, FARID;GISBERGEN, VAN, JOZEFUS, GODEFRIDUS, GERARDUS, PANCRATIUS;WILLEKENS, JEROEN, PIETER, FRANK |