发明名称 SEMICONDUCTOR DEVICE AND PROCESS FOR PRODUCING THE SAME
摘要 <p>Stable contact hole forming is attained even when an aluminum oxide film is present between layers provided with contact holes. The process comprises the steps of forming a first element layer on a semiconductor substrate; forming a first interlayer insulating film on the first element layer; forming a second element layer on the first interlayer insulating film; forming a second interlayer insulating film on the second element layer; forming a hole resist pattern on the second interlayer insulating film; conducting a first etching for forming of holes by etching the second interlayer insulating film; and conducting a second etching for extending of holes to the first element layer by etching the first interlayer insulating film.</p>
申请公布号 WO2008117426(A1) 申请公布日期 2008.10.02
申请号 WO2007JP56358 申请日期 2007.03.27
申请人 FUJITSU MICROELECTRONICS LIMITED;MIYAZAKI, YUKIMASA;NAGAI, KOUICHI;KIKUCHI, HIDEAKI 发明人 MIYAZAKI, YUKIMASA;NAGAI, KOUICHI;KIKUCHI, HIDEAKI
分类号 H01L21/8246;H01L21/768;H01L23/522;H01L27/105 主分类号 H01L21/8246
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