| 摘要 |
<p>A reference station (3) has a reference film (5) on which a laser beam deflector (1) writes a predetermined pattern as a reference pattern. A detector optically senses the reference film such as plastic to detect the reference pattern. A controller compares the detected reference pattern with the predetermined pattern and finds the deviation between the predetermined pattern and the reference pattern for correcting scanning of the laser beam by the laser beam deflector. An independent claim is included for method for correcting deflection or scanning of laser beam deflector.</p> |
