SEMICONDUCTOR DEVICE TESTER, TEST SYSTEM FOR SEMICONDUCTOR DEVICE HAVING PLURAL SEMICONDUCTOR DEVICE TESTER, AND TESTING METHOD FOR SEMICONDUCTOR DEVICE USING THE SAME

摘要

A semiconductor tester, a semiconductor device test system including the same, and a semiconductor device test method using the same are provided to achieve unmanned automation by using a transfer unit and a pickup transfer unit. A supply and discharge unit(100) supplies a semiconductor device as a test target and discharges the semiconductor device of high quality. A test unit includes a plurality of test regions(210) having an insertion hole into which the semiconductor device is inserted. An inferior semiconductor device loading unit(300) loads the semiconductor device of low quality. A transfer unit(400) is positioned between the supply and discharge unit and the test unit to transfer the semiconductor device from the supply and discharge unit to the test unit.