发明名称 Device manufacturing method and substrate processing apparatus, and substrate support structure
摘要 <p>A substrate (5; 42) can efficiently be manufactured by separating the alignment and the actual processing when an alignment mark (6a, 6b; 12a...d; 44a...c) is provided, which is fixed with respect to the substrate (5; 42) and when position information on a position of a process area on the substrate (5; 42) is retrieved with respect to the alignment mark (6a, 6b; 12a...d; 44a...c) before the substrate (5; 42) is processed. During the processing alignment can then be performed by redetermining the position of the alignment mark (6a, 6b; 12a...d; 44a...c) only once and by using the stored position information on the position of the process area.</p>
申请公布号 EP1832933(B1) 申请公布日期 2008.10.01
申请号 EP20060004734 申请日期 2006.03.08
申请人 THALLNER, ERICH 发明人 THALLNER, ERICH
分类号 G03F9/00;G03F7/20 主分类号 G03F9/00
代理机构 代理人
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