发明名称 INFORMATION PROCESSING SYSTEM AND INFORMATION PROCESSING METHOD ACCEPTANCE/REJECTION EVALUATING DEVICE
摘要 <p>It is convenient in designing a particulate-related apparatus to be able to simply evaluate whether or not to consider diffraction, except when designing an optical system. Diffraction of a de Broglie wave is likely to occur in the presence of a structure that significantly narrows a particle passage in an apparatus, for example, a slit opening. Whether the diffraction of a de Broglie wave or phase wave inside an object of design can be neglected or not is evaluated by calculating the diffraction pattern of statistical wave function (?) based on Fresnel-Kirchhoff's diffraction formula. Since a de Broglie wavelength becomes very short when a particle velocity approaches a light velocity even in the case of microscopic particles, it is normally not necessary for an accurate evaluation of diffraction to take into account a wave nature. Only relativistic particle dynamics, that is, a special relative theory needs to be used for designing an apparatus relating to such particles. Also, when semi-relativistic binary dynamics can be applied, only semi-relativistic particle dynamics needs to be used if de Broglie wave diffraction can be neglected. In either case, unification of binary dynamics is implied.</p>
申请公布号 EP1975590(A1) 申请公布日期 2008.10.01
申请号 EP20060843790 申请日期 2006.12.28
申请人 SUZUKI, TAKASHI 发明人 SUZUKI, TAKASHI
分类号 G01M99/00;G06N 主分类号 G01M99/00
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