TestMode Control Circuit,申请号KR20070017607-传众专利搜索

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发明名称	TestMode Control Circuit
摘要
申请公布号	KR100861365(B1)	申请公布日期	2008.10.01
申请号	KR20070017607	申请日期	2007.02.21
申请人		发明人
分类号	G11C29/00;G11C7/22	主分类号	G11C29/00
代理机构		代理人
主权项
地址

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