| 摘要 |
The present invention provides a memory BISR architecture for a slice. The architecture includes (1) a plurality of physical memory instances; (2) a Mem_BIST controller, communicatively coupled to the plurality of physical memory instances, for testing the plurality of physical memory instances; (3) a FLARE module, communicatively coupled to the Mem_BIST controller, including a scan chain of registers for storing test results of the plurality of physical memory instances, each of the plurality of physical memory instances M_i being assigned one FLARE bit f_i, i=1, 2, . . . , n, the FLARE module being used by the Mem_BIST controller to scan in an error vector F=(f<SUB>-</SUB> 1, f<SUB>-</SUB> 2 , . . . , f_n); (4) a BISR controller, communicatively coupled to the FLARE module, a ROM module and a REPAIR_CONFIGURATION module, for scanning out the error vector F from the FLARE module to computer a repair configuration vector R=(r<SUB>-</SUB> 1 , r<SUB>-</SUB> 2 , . . . , r_n); and (5) a FUSE module, communicatively coupled to the BISR controller and the REPAIR_CONFIGURATION module, for storing the repair configuration vector R. The REPAIR_CONFIGURATION module, communicatively coupled to the plurality of physical memory instances M_i and an integrated circuit design D, includes switch module instances S for switching among the plurality of physical memory instances in accordance with the repair configuration vector R. The ROM module stores a vector U indicating usage of the plurality of physical memory instances M_i by the integrated circuit design D.
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