| 摘要 |
Device for determining the properties of surfaces having at least one first radiation means having at least one first radiation source which directs a predetermined radiation towards a measurement surface; at least one first radiation detector means which captures at least a portion of the radiation reflected and/or diffused off the measurement surface and emits at least one measurement signal which is characteristic of the reflected and/or diffused radiation, wherein at least one second radiation means is provided which directs at least partially directional radiation at a predetermined angle towards the measurement surface, and at least one second radiation detector means having a predetermined radiation detector surface, which at least partially captures the radiation emitting from the second radiation means and reflected off the measurement surface, and determines its position on the detector surface.
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