| 摘要 |
A gap adjuster for a test handler and a method for transferring a semiconductor device using the same are provided to continuously transfer the semiconductor device to the gap adjuster without stopping while a test tray is replaced in a semiconductor exchanger. A customer tray is placed on a loader set plate. A test tray is replaced in an exchanger(50). Plural semiconductor device loading grooves are included in more than two regions of a gap adjuster for a test handler. A gap between two stack grooves of the gap adjuster is controlled according to a gap between the stack grooves in two test trays. A slant portion is formed in the semiconductor device stack groove, such that the semiconductor device is moved in a horizontal direction by a predetermined distance. |
