| 摘要 |
<p>The present invention relates to a method and an apparatus for assessing parameters in a material by measurement, such as optical measurement, whereby material characterization may be conducted non-invasively through accurate extraction of optical parameters. More particularly the present invention relates to a method, a system and a device for assessing quality and/or quantity parameters in a material using coherence interferometry and/or reflectometry. The object under investigation is illuminated with light from a broadband light source and the backscattered light from the object interferes with a reference signal to produce an interference signal, from which parameters of the material can be determined. Thereby several parameters such as optical parameters and parameters relating to the physical and chemical composition of the material can be extracted. The present invention may be used for determination provide for a variety of parameters, such as concentration, particle size, and/or chemical composition.</p> |
