发明名称 SEMICONDUTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
摘要 A semiconductor device and a manufacturing method thereof are provided to suppress an erosion effect and to define an alignment mark by increasing a thickness of conductive material deposited in a dummy region. A chip region and a dummy region are defined on a substrate(10). An insulating layer is formed on the substrate. A plurality of via-holes(30) are formed in the insulating layer corresponding to the chip region. The via-holes are filled with conductive material. A recess(40) is formed on the insulating layer corresponding to the dummy region. The recess is filled with conductive material(50). The thickness of the conductive material filled in the recess is 1.5 to 3 times to the width of the via hole.
申请公布号 KR100859634(B1) 申请公布日期 2008.09.23
申请号 KR20070047863 申请日期 2007.05.16
申请人 DONGBU HITEK CO., LTD. 发明人 JEONG, YOUNG SEOK;LEE, HAN CHOON
分类号 H01L21/304;H01L21/31 主分类号 H01L21/304
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