发明名称 |
SEMICONDUTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME |
摘要 |
A semiconductor device and a manufacturing method thereof are provided to suppress an erosion effect and to define an alignment mark by increasing a thickness of conductive material deposited in a dummy region. A chip region and a dummy region are defined on a substrate(10). An insulating layer is formed on the substrate. A plurality of via-holes(30) are formed in the insulating layer corresponding to the chip region. The via-holes are filled with conductive material. A recess(40) is formed on the insulating layer corresponding to the dummy region. The recess is filled with conductive material(50). The thickness of the conductive material filled in the recess is 1.5 to 3 times to the width of the via hole.
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申请公布号 |
KR100859634(B1) |
申请公布日期 |
2008.09.23 |
申请号 |
KR20070047863 |
申请日期 |
2007.05.16 |
申请人 |
DONGBU HITEK CO., LTD. |
发明人 |
JEONG, YOUNG SEOK;LEE, HAN CHOON |
分类号 |
H01L21/304;H01L21/31 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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