发明名称 Piezoelectric actuator and scanning probe microscope using the same
摘要 A leaf spring 4 constituting an elastic member one end of which is fixed to a foundation 6 , and other end of which is brought into contact with a laminating type piezoelectric element 2 or a driven member 5 is constituted such that a thickness is thinned from a side of the foundation 6 to a side of the laminating type piezoelectric element 2 to make a moment of inertia smaller on a side of a portion of other end held by the laminating type piezoelectric element 2 than a portion on one end side fixed to the foundation 6 . Further, a strain gage sensor 8 is attached to a side face 4 a of the leaf spring 4 constituting one face of one end of the leaf spring 4 proximate to the laminating type piezoelectric element 2 orthogonal to a direction of elongating and contracting the laminating type piezoelectric element 2 constituting a side of the driven member 5.
申请公布号 US7427744(B2) 申请公布日期 2008.09.23
申请号 US20070827110 申请日期 2007.07.10
申请人 SII NANOTECHNOLOGY INC. 发明人 WATANABE MASAFUMI
分类号 H01J40/14;G01Q10/04 主分类号 H01J40/14
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