发明名称 Method of forming a three-dimensional image of a pattern to be inspected and apparatus for performing the same
摘要 In a method and apparatus for forming a three-dimensional image for an inspection pattern, a reference intensity function of an inspection X-ray is formed in accordance with a continuous scanning depth, and is differentiated with respect to the scanning depth. The differential reference intensity function is decomposed into a start function and a characteristic function. The differential reference intensity function is then repeatedly integrated while a temporary vertical profile function is substituted for the start function until the temporary intensity of a reference X-ray is within an allowable error range. The temporary vertical profile function satisfying the error range is selected as an optimal vertical profile function. A surface shape is combined to the optimal vertical profile function along a depth of the inspection pattern to thereby form the three-dimensional image for the inspection pattern.
申请公布号 US7428328(B2) 申请公布日期 2008.09.23
申请号 US20050180504 申请日期 2005.07.12
申请人 SAMSUNG ELECTRONIC CO., LTD. 发明人 JEE YUN-JUNG;JUN CHUNG-SAM;YANG YU-SIN;KIM TAE-KYOUNG
分类号 G06K9/00 主分类号 G06K9/00
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