发明名称 POST CMP PROCESSING LIQUID AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE USING THE SAME
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a post CMP processing liquid efficiently removing extraneous matters on the surfaces of an interconnection layer and an insulation film. <P>SOLUTION: This processing liquid contains water, an amphoteric surfactant, an anionic surfactant, a complexing agent, resin particles having carboxyl groups and sulfonyl groups on surfaces and each primary particle size≥10 mm and≤60 mm, and tetramethyl ammonium hydroxide. The pH is≥4 and≤9, and each polishing speed of the insulation film and a conductive film is≤10 nm/min. <P>COPYRIGHT: (C)2008,JPO&INPIT</p>
申请公布号 JP2008213113(A) 申请公布日期 2008.09.18
申请号 JP20070056185 申请日期 2007.03.06
申请人 TOSHIBA CORP 发明人 KURASHIMA NOBUYUKI;MINAMI FUKUGAKU;TATEYAMA YOSHIKUNI;YANO HIROYUKI
分类号 B24B37/00;B82Y10/00;H01L21/304 主分类号 B24B37/00
代理机构 代理人
主权项
地址