发明名称 DYNAMIC CONTROL OF PROCESS CHEMISTRY FOR IMPROVED WITHIN-SUBSTRATE PROCESS UNIFORMITY
摘要 A method and system for dynamically controlling a process chemistry above a substrate is described. The system for adjusting the process chemistry comprises a ring configured to surround a peripheral edge of a substrate in a vacuum processing system. The ring comprises one or more gas distribution passages formed within the ring and configured to supply an additive process gas through an upper surface of the ring to the peripheral region of the substrate, wherein the one or more gas distribution passages are configured to be coupled to one or more corresponding gas supply passages formed within the substrate holder upon which the ring rests.
申请公布号 US2008223873(A1) 申请公布日期 2008.09.18
申请号 US20070684853 申请日期 2007.03.12
申请人 TOKYO ELECTRON LIMITED 发明人 CHEN LEE;SUNDARARAJAN RADHA;FUNK MERRITT
分类号 C23F1/02 主分类号 C23F1/02
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