发明名称 |
RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN, AND PROCESS FOR MANUFACTURING ELECTRONIC DEVICE |
摘要 |
<p>A resist composition that in the technology of liquid immersion exposure, inhibits leaching into a liquid immersion medium and avoids performance deterioration, thereby attaining forming of a fine resist pattern; and, using the resist composition, a method of forming a resist pattern and process for manufacturing an electronic device. There is provided a resist composition for use in liquid immersion exposure, comprising at least a silicon compound having at least an optionally substituted alkali-soluble group and a resin having an alkali-soluble group optionally substituted with an acid elimination group.</p> |
申请公布号 |
WO2008111203(A1) |
申请公布日期 |
2008.09.18 |
申请号 |
WO2007JP55145 |
申请日期 |
2007.03.14 |
申请人 |
FUJITSU LIMITED;KOZAWA, MIWA;NOZAKI, KOJI |
发明人 |
KOZAWA, MIWA;NOZAKI, KOJI |
分类号 |
G03F7/075;G03F7/039;H01L21/027 |
主分类号 |
G03F7/075 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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