发明名称 INSPECTION METHOD OF CULTURAL PROPERTIES BY TERAHERTZ SPECTRAL DIFFRACTION
摘要 <p><P>PROBLEM TO BE SOLVED: To provide an inspection method of a cultural property for identifying a material used for manufacture, by analyzing the cultural properties by means of a nondestructive method. <P>SOLUTION: A method for analyzing a material included in cultural properties includes at least one material between a die, a pigment, a color developing agent and a surface protection agent used for the cultural property is applied and cured onto a basic material fully transmissible by terahertz waves, whose absorption or reflection spectrum is known, to thereby prepare a sample; the sample is irradiated with the terahertz waves having an approximately continuously-different wavelength, and the absorption or reflection spectrum is determined by a transmission or reflection spectroscopy; a material applied onto the basic material is changed, and the absorption or the reflection spectrum in each sample is determined, and thereby each absorption or reflection spectrum database of the terahertz wave by various materials, such as the die, the pigment, the color developing agent or the surface protection agent used for the cultural properties is acquired; and the cultural property which is an object of analysis is irradiated with the terahertz wave and its absorption characteristics are analyzed, based on each acquired database, to thereby identify a material included in the cultural property. <P>COPYRIGHT: (C)2008,JPO&INPIT</p>
申请公布号 JP2008215914(A) 申请公布日期 2008.09.18
申请号 JP20070051094 申请日期 2007.03.01
申请人 NATIONAL INSTITUTE OF INFORMATION & COMMUNICATIONTECHNOLOGY 发明人 FUKUNAGA KO;HOSAKO IWAO;OGAWA YUICHI
分类号 G01N21/35;G01N21/3581 主分类号 G01N21/35
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