| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor test system that does not affect the accuracy of measurement under execution while shortening the switching period of a test program. SOLUTION: This semiconductor test system comprises a server 20 for storing a plurality of test programs to a semiconductor device and transferring a test program to a tester according to the transfer request from the tester, a test executing means 34 that is disposed in the tester 30 and measures the device according to one test program, a spare time recognizing means 36 for recognizing the measurement stopping time to the device, and a transfer requesting means 40 for requesting the transfer of another test program from the server during the measurement stopping time. COPYRIGHT: (C)2008,JPO&INPIT
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