| 摘要 |
PROBLEM TO BE SOLVED: To efficiently repair a defective line by replacement by a spare line in an array divided into blocks. SOLUTION: A spare memory array (SP#0) having spare memory cells common to a plurality of normal sub-arrays having a plurality of normal memory cells is provided. The defective line of the spare memory array (SP#0) can be replaced by the normal line in the corresponding plurality of normal sub-arrays (MB#00 to MB#n). COPYRIGHT: (C)2008,JPO&INPIT
|
