发明名称 CELL DATA FOR SPARE CELL, METHOD OF DESIGNING A SEMICONDUCTOR INTEGRATED CIRCUIT, AND SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 In a cell base design, when a circuit using a spare cell is corrected, a wiring length is shortened as much as possible, and the number of wiring layers which are affected by correction is reduced. Mask pattern data that expresses the configurations of a signal input terminal and a signal output terminal of a spare cell is set to mask pattern data of a wiring layer that is equal to or higher than a second wiring layer. As a result, the length of a wiring that is connected to the spare cell can be shortened as much as possible.
申请公布号 US2008224321(A1) 申请公布日期 2008.09.18
申请号 US20080046483 申请日期 2008.03.12
申请人 NEC ELECTRONICS CORPORATION 发明人 JINNO JUNJI
分类号 H01L23/48;G06F17/50 主分类号 H01L23/48
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