发明名称 CAPACITOR TOP PLATE OVER SOURCE/DRAIN TO FORM A 1T MEMORY DEVICE
摘要 A method and structure for a memory device, such as a 1T-SRAM, having a capacitor top plate directly over a doped bottom plate region. An example device comprises the following. An isolation film formed as to surround an active area on a substrate. A gate dielectric and gate electrode formed over a portion of the active area. A source element and a drain element in the substrate adjacent to the gate electrode. The drain element is comprised of a drain region and a bottom plate region. The drain region is between the bottom plate region and the gate structure. A capacitor dielectric and a capacitor top plate are over at least portions of the bottom plate region.
申请公布号 US2008224228(A1) 申请公布日期 2008.09.18
申请号 US20070686475 申请日期 2007.03.15
申请人 发明人 TEO LEE WEE;LEE YONG MENG;LUN ZHAO;LAI CHUNG WOH;TAN SHYUE SENG;CHEE JEFFREY;MISHRA SHAILENDRA;WIDODO JOHNNY
分类号 H01L29/76;H01L29/94;H01L31/00 主分类号 H01L29/76
代理机构 代理人
主权项
地址