发明名称 PATTERN EXPOSURE METHOD AND DEVICE, AND PHOTOMASK
摘要 <P>PROBLEM TO BE SOLVED: To easily and inexpensively expose a pattern by exposure onto the top and back faces of a support without misalignment. <P>SOLUTION: A first photosensitive layer 19 and a second photosensitive layer 20 provided on the top and back faces of a transparent film 3, respectively, are irradiated with light through a photomask 29 disposed opposing to the first photosensitive layer 19. The light beams L1, L2 in the first and second wavelength bands corresponding to spectral sensitivities of the first photosensitive layer 19 and the second photosensitive layer 20, respectively, transmit through a first filter layer 35 and a second filter layer 36 provided on the photomask 29, and simultaneously expose a first pattern 39 and a second pattern 40 provided in the respective filter layers onto the photosensitive layer 19 and the second photosensitive layer 20. <P>COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008216799(A) 申请公布日期 2008.09.18
申请号 JP20070056144 申请日期 2007.03.06
申请人 FUJIFILM CORP 发明人 MIYAMOTO HARUHIKO;SUZUKI EIJI;AJINO SATOSHI
分类号 G03F7/20;G03F1/00;G03F1/54;H01L21/027 主分类号 G03F7/20
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