发明名称 FIELD-EFFECT SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR
摘要 PROBLEM TO BE SOLVED: To constitute a film, containing at least nitrogen and whose principal constituent is silicon, with superior composition control properties, without giving damages to a gate insulating film, regarding a field-effect semiconductor device and its manufacturing method. SOLUTION: A conductive film containing silicon and nitrogen, which is 5-30 atomic number% with respect to silicon, is employed as at least one part of a gate electrode 3. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008218661(A) 申请公布日期 2008.09.18
申请号 JP20070053217 申请日期 2007.03.02
申请人 FUJITSU LTD 发明人 SUGITA YOSHIHIRO
分类号 H01L29/78;H01L29/423;H01L29/49 主分类号 H01L29/78
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