发明名称 Methods of forming a semiconductor device
摘要 Methods of forming a semiconductor device include forming a mask layer on a semiconductor substrate. The mask layer has vertically and horizontally extending portions. The vertically extending portions have a thickness selected to provide a desired line width to an underlying structure to be formed using the mask layer and a height greater than a height of the horizontally extending portions. The underlying structure is formed using the mask layer.
申请公布号 US2008227258(A1) 申请公布日期 2008.09.18
申请号 US20080074992 申请日期 2008.03.07
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK SANG-YONG;KWON SUNG-HYUN;SIM JAE-HWANG;KIM KEON-SOO;PARK JAE-KWAN
分类号 H01L21/336;H01L21/31 主分类号 H01L21/336
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