| 摘要 |
PROBLEM TO BE SOLVED: To provide a compensation layer characteristic evaluation method capable of exactly and accurately evaluating the optical characteristics of a compensation layer without peeling the compensation layer from an optical film body, namely, without giving rise to the destruction and optical characteristic change of the compensation layer, or a compensation layer optical characteristic evaluation system which can be used for the method. SOLUTION: The compensation layer characteristic evaluation method for evaluating the optical characteristics of the compensation layer in an optical film constituted by laminating at least a polarizer and the compensation layer comprises an optical characteristic data preparation step, an ellipticity measurement step of measuring the ellipticity of the polarized light of an optical film sample, and an optical characteristic data extraction step of extracting the data coinciding with or approximating to the ellipticity of the polarized light measured from the data prepared in the optical characteristic data preparation step. COPYRIGHT: (C)2008,JPO&INPIT
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