发明名称 Transistor on the basis of new quantum interference effect
摘要 A quantum interference transistor comprising a thin metal film having a protrusion and a thin insulating layer between the metal film and protrusion. A potential barrier is formed in the region beneath the protrusion as a result of quantum interference caused by the geometry of the film and protrusion. A voltage applied between the electrically isolated protrusion ("island") and the thin film leads to a change in the electron wave function of the island which in turn leads to a change in the Fermi level of the metal film in the entire region beneath the protrusion. Consequently, a potential barrier may or may not exist depending on the applied voltage, thus providing the present invention with the transistor-like property of switching between open and closed states.
申请公布号 US2008224124(A1) 申请公布日期 2008.09.18
申请号 US20080075943 申请日期 2008.03.13
申请人 TAVKHELIDZE AVTO 发明人 TAVKHELIDZE AVTO
分类号 H01L29/06 主分类号 H01L29/06
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