发明名称 MULTI-BIT RESISTIVE MEMORY
摘要 <p><P>PROBLEM TO BE SOLVED: To shorten the access time of a multi-bit memory cell of a phase change memory that indicates a resistance states of two kinds or more. <P>SOLUTION: The multi-bit resistive memory includes a multi-bit resistive memory cell 112 and an inverted data indicator 114 that is a single-bit resistive memory cell for storing whether data stored in the multi-bit resistive memory cell is inverted. The multi-bit resistive memory cell includes a half of the low-resistance state and a half of high-resistance state, data are stored in the lower half resistive state, by inverting a data scheduled to be stored in the higher half resistance state. <P>COPYRIGHT: (C)2008,JPO&INPIT</p>
申请公布号 JP2008217963(A) 申请公布日期 2008.09.18
申请号 JP20070312541 申请日期 2007.12.03
申请人 QIMONDA NORTH AMERICA CORP 发明人 NIRSCHL THOMAS
分类号 G11C13/00;H01L27/105 主分类号 G11C13/00
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