发明名称 MOS transistors with selectively strained channels
摘要 The channels of first and second CMOS transistors can be selectively stressed. A gate structure of the first transistor includes a stressor that produces stress in the channel of the first transistor. A gate structure of the second transistor is disposed in contact with a layer of material that produces stress in the channel of the second transistor.
申请公布号 US2008224225(A1) 申请公布日期 2008.09.18
申请号 US20070717450 申请日期 2007.03.13
申请人 KO CHIH-HSIN;LEE WEN-CHIN;KE CHUNG-HU;CHEN HUNG-WEI 发明人 KO CHIH-HSIN;LEE WEN-CHIN;KE CHUNG-HU;CHEN HUNG-WEI
分类号 H01L21/8238 主分类号 H01L21/8238
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