发明名称 Method of sulfuration treatment for a strained InAlAs/InGaAs metamorphic high electron mobility transistor
摘要 This invention relates to a method of sulfuration treatment for InAlAs/InGaAs metamorphic high electron mobility transistor (MHEMT), and the sulfuration treatment is applied to the InAlAs/InGaAs MHEMT for a passivation treatment for Gate, in order to increase initial voltage, lower the surface states and decrease surface leakage current, which makes the MHEMT work in a range of high current density and high input power.
申请公布号 US2008227246(A1) 申请公布日期 2008.09.18
申请号 US20070716826 申请日期 2007.03.12
申请人 CHANG GUNG UNIVERSITY 发明人 CHIU HSIEN-CHIN;CHANG LIANN-BE;HUANG YUAN-CHANG;CHEN CHUNG-WEN;LEE WEI-HSIEN
分类号 H01L21/338 主分类号 H01L21/338
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