发明名称 SEMICONDUCTOR MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 A semiconductor memory device includes a first resistance change element having a first portion and a second portion, the first portion and the second portion having a first space in a first direction, and a second resistance change element formed to have a distance to the first resistance change element in the first direction, and having a third portion and a fourth portion, the third portion and the fourth portion having a second space in the first direction, and the first space and the second space being shorter than the distance.
申请公布号 US2008224117(A1) 申请公布日期 2008.09.18
申请号 US20080048819 申请日期 2008.03.14
申请人 IWAYAMA MASAYOSHI 发明人 IWAYAMA MASAYOSHI
分类号 H01L45/00;H01L21/00;H01L29/82 主分类号 H01L45/00
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