| 摘要 |
<p>This invention provides a micro test piece polishing apparatus, which is less likely to cause bending or damage to a micro test piece, can realize a high working efficiency, and can manufacture micro test pieces having a uniform quality. A micro test piece polishing apparatus (1) is used for polishing the surface of a micro test piece (3) having a circular cross-section with a string-shaped member (13). The micro test piece polishing apparatus (1) comprises string-shaped member delivery/collection means (10), abrasive material adhering means (20), holding/rotating means (30), and pressing/scanning means (40). An abrasive material is adhered, by the abrasive material adhering means (20), onto the string-shaped member delivered by the string-shaped member delivery/collection means (10). Thereafter, the string-shaped member (13), to which the abrasive material has been adhered, is pressed and scanned onto the micro test piece (3), which is held and rotated by the holding/rotating means (30) by the pressing/scanning means (40), to polish the micro test piece (3).</p> |
