SEMICONDUCTOR DEVICE HAVING INTERNAL MEMORY

摘要

PURPOSE: A semiconductor device having an internal memory is provided to reduce test time by carrying out a test while converting a direct access test mode into a self test mode and vice versa by sharing pads for performing the direct access test mode and the self test mode. CONSTITUTION: A signal(S11a) is an address signal transmitted to a memory block(20) from a pad(84) or a data signal transmitted to a logic block(10) from the pad(84). A signal(S11b) is a control signal transmitted to the memory block(20) from the pad(86), a data signal transmitted to the logic block(10) from a pad(86), or BIST control signal transmitted to an internal test circuit block(30) from the pad(86). A signal(S11c) is a data signal transmitted to the logic block(10) from the pad(88), a test data signal transmitted to the memory block(20) from the pad(88), or a test result signal transmitted to the pad(88) from the internal test circuit block(30).