发明名称 Complementary giant magneto-resistive memory with full-turn word line
摘要 A magneto-resistive memory system is presented that includes a radiation-hardened and low power memory cell. The magneto-resistive memory cell includes a word line select transistor in the cell to help eliminate unselected cell disturbances. Furthermore, the magneto-resistive memory cell includes a full-turn write word line that writes true and complimentary bit values using less current than previous cell architectures. The improved memory cell may be used in a memory system with precision current drivers and auto-zero sense amplifiers in order to further lower power and improve overall system reliability.
申请公布号 US7426133(B2) 申请公布日期 2008.09.16
申请号 US20050257327 申请日期 2005.10.24
申请人 HONEYWELL INTERNATIONAL, INC. 发明人 HYNES OWEN J.;WANG ROY R.;KATTI ROMNEY R.;REED DANIEL S.
分类号 G11C11/00 主分类号 G11C11/00
代理机构 代理人
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