Device and method for sensing programming status of non-volatile memory elements

摘要

A test circuit can test a status of a group of non-volatile elements. A current flowing to the group of non-volatile elements can be compared against a reference value. If the current is determined to be outside of a predetermined range, the non-volatile elements can be determined to be programmed. In particular embodiments, non-volatile elements can be sections of differential one-time programmable anti-fuse latch memory elements.