发明名称 Set/reset latch with minimum single event upset
摘要 A method and latch circuits are provided for implementing enhanced noise immunity performance. Each latch circuit includes any L1 latch and an L2 latch coupled to the L1 latch. Data is first latched in the L1 latch during a first half clock cycle and then latched in the L2 latch during a second half clock cycle. A path opposite a latched data state is gated off in both the L1 latch and the L2 latch, where a path to a voltage supply rail is gated off with a latched low data state and a path to ground is gated off with a latched high data state.
申请公布号 US7425855(B2) 申请公布日期 2008.09.16
申请号 US20050181707 申请日期 2005.07.14
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 CHEN DAVID JIA;NOSOWICZ EUGENE JAMES
分类号 H03K2/289 主分类号 H03K2/289
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