发明名称 Verfahren und Anordnung zur zerstörungsfreien Prüfung
摘要 The invention relates to a method and to an arrangement for non-destructive testing of materials, in particular, non-metallic workpieces. According to the invention, a high-frequency emitter signal in the frequency range of the eddy-current defectoscopy is transformed into a signal in the frequency range of the microwave defectoscopy, in a first step and then said signal is guided to a workpiece which is to be examined and subsequently, the signal reflected by the workpiece or transmitted through the workpiece is detected and said signal which is modified by the properties of the workpiece in characteristic parameters is transformed to a frequency in the frequency range of the eddy-current defectoscopy and finally guided to an eddy-current device for display. The arrangement for non-destructive testing is connected to an eddy-current device comprising an evaluating and displaying device and a ballast which transforms the frequency of the emitted and/or the reflected signal.
申请公布号 DE112006002761(A5) 申请公布日期 2008.09.04
申请号 DE20061102761T 申请日期 2006.08.14
申请人 HOCHSCHULE MAGDEBURG-STENDAL (FH);ESA PATENTVERWERTUNGSAGENTUR SACHSEN-ANHALT GMBH 发明人 HINKEN, JOHANN;BEILKEN, DIRK
分类号 G01N22/02 主分类号 G01N22/02
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