发明名称 SCANNING ELECTRON MICROSCOPE USING PERMANENT MAGNETIC LENS
摘要 PROBLEM TO BE SOLVED: To provide an ultracompact SEM using a permanent magnetic lens in which change of the number of stages of condensing lens can be achieved relatively easily according to an accelerating voltage due to magnetic saturation. SOLUTION: In Fig.1, as for the electron lens at an acceleration voltage 5 kV, an auxiliary condensing lens 3 is detached. At the acceleration voltage 5 kV, there is no magnetic saturation of a condensing lens, and two-stage lens can be used. Then, when the acceleration voltage is made 15 kV, the condensing lens of two stages has magnetic saturation and sufficient reduction ratio can not be obtained, thereby, the auxiliary condensing lens 3 is inserted between a condensing lens (1) 4 and an anode. Thereby, the reduction portion of this reduction ratio at the condensing lens (1) 4 and the condensing lens (2) 5 is supplemented by this auxiliary lens, and the condensing lens as a whole has no reduction in the reduction ratio. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008204749(A) 申请公布日期 2008.09.04
申请号 JP20070038708 申请日期 2007.02.20
申请人 TECHNEX LAB CO LTD 发明人 ONO TERUAKI
分类号 H01J37/28;H01J37/143 主分类号 H01J37/28
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